- 品牌：
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- NXP USA Inc. (2)
- ON Semiconductor (1)
- Texas Instruments (14)
- Part Status：
-
- Operating Temperature：
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- Supplier Device Package：
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22 条记录
| 图片 | 型号 | 品牌 | 描述 | 参考价格 | 起订量 | 参考库存 | 操作 |
|---|---|---|---|---|---|---|---|
|
Rochester Electronics, LLC | SN74ABT8646 SCAN TE... |
|
34 | 3,229 | 加入购物车 提交询价 | |
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Texas Instruments | IC SCAN-TEST-DEV/... |
|
60 | 核实库存 | 提交询价 | |
|
|
Texas Instruments | IC SCAN TEST DEVI... |
|
1 | 7 | 加入购物车 提交询价 | |
|
|
Texas Instruments | IC SCAN-PATH LINK... |
|
40 | 核实库存 | 提交询价 | |
|
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Texas Instruments | IC SCAN TEST DEVI... |
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|
1 | 核实库存 | 提交询价 | |
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Texas Instruments | IC SCAN TEST DEVI... |
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1 | 核实库存 | 提交询价 | |
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Texas Instruments | IC SCAN TEST DEVI... |
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1 | 核实库存 | 提交询价 | |
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Texas Instruments | IC SCAN TEST DEVI... |
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1 | 核实库存 | 提交询价 | |
|
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Texas Instruments | IC SCAN TEST DEVI... |
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|
1 | 核实库存 | 提交询价 | |
|
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Texas Instruments | IC SCAN TEST DEVI... |
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|
1 | 核实库存 | 提交询价 | |
|
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Texas Instruments | IC SCAN TEST DEVI... |
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1 | 核实库存 | 提交询价 | |
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Texas Instruments | IC SCAN TEST DEVI... |
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1 | 核实库存 | 提交询价 | |
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Texas Instruments | IC SCAN TEST DEVI... |
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|
1 | 核实库存 | 提交询价 | |
|
NXP USA Inc. | IC 9BIT DUAL LATC... |
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1 | 核实库存 | 提交询价 | |
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NXP USA Inc. | IC 9BIT DUAL LATC... |
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|
1 | 核实库存 | 提交询价 | |
|
|
Rochester Electronics, LLC | BOUNDARY SCAN TR... |
|
46 | 2,000 | 加入购物车 提交询价 | |
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Rochester Electronics, LLC | BOUNDARY SCAN TR... |
|
38 | 5,930 | 加入购物车 提交询价 | |
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|
Rochester Electronics, LLC | BOUNDARY SCAN TR... |
|
28 | 1,000 | 加入购物车 提交询价 | |
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|
Rochester Electronics, LLC | SN74ACT8997 SCAN PA... |
|
20 | 1,003 | 加入购物车 提交询价 | |
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Texas Instruments | IC SCAN-TEST-DEV/... |
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|
1 | 核实库存 | 提交询价 |
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